Net Access machines support electrical tests for value and need testpoint definitions. In general this is results come out of the DFT Preperation see DFT manual

At the top area there is a overview:

The Test Access Analysis gives you an overview over all possible net contacts. The entries contain optional probes from the DFT session.

In the Probe Placement there is a overview of defined probes for the machine exports, this contains only forced probes no optional/alternative probe settings.